Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...
It has been over 30 years since the first focused ion beam was used to make a TEM specimen. FEI, a company that is now part of Thermo Fisher Scientific, has been an essential part of helping take ion ...
The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...
TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
Prepare samples by coating, drying, etching, milling, polishing, and sectioning. The Leica CPD 030 Critical Point Dryer is a critical point drying device for biological and industrial samples. It uses ...
The combination of cutting‑edge features is fitting for a facility serving multiple fields including microbiology, food ...
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