Loaded board testing pays for itself by reducing field returns and bone-pile scrap. You seldom read an article about PCBs or semiconductors without encountering test-related phrases and acronyms. Cost ...
This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results