The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Taken literally, embedded test is just that: test capabilities that exist wholly embedded within a system. Power-on self-test is an example as is a built-in performance-monitoring feature programmed ...