The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...

Changing market forces are making design-for-testability tools a more critical part of the savvy design engineer’s toolset Design for testability (DFT) is not a new concept. But the reasons why ...

Design for testability (DFT), a way to build testability into an integrated circuit (IC) at the design stage to lower testing costs and increase manufacturing yield, has been around for many years in ...

The development cycle of an integrated circuit (IC) –– or informally, chip –– from the conceptual stage to production and shipping to end-users involves several stages. One metric to measure the ...

As gate counts continue to swell at a rapid pace, modern systems-on-chip (SoCs) are increasingly integrating more design-for-testability (DfT) capabilities 1. Test and diagnosis of complex integrated ...

Semiconductor companies are racing to develop AI-specific chips to meet the rapidly growing compute requirements for artificial intelligence (AI) systems. AI chips from companies like Graphcore and ...

Atrenta Inc., the leading provider of SoC Realization solutions for the semiconductor and consumer electronics industries, announced that MediaTek has adopted Atrenta's SpyGlass DFT (Design for Test) ...

ANDOVER, Mass.-- January 24, 2011--Avery Design Systems Inc., an innovator in functional verification productivity solutions, today announced it has developed a new capability for its Insight formal ...

Whether you are a DFT engineer or a SoC designer, connectivity validation will no doubt be a top priority when taking steps to guarantee the functionality and reliability of your device. SoC designs ...

JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...